Hao Lin, Haitao Liu, et al.
LEC 2006
Paper
IIA-6 Sensitivity of Threshold Voltage and Sheet Carrier Concentration to Material and Electronic Parameters in a HEMT Device
Abstract
No abstract available.
Related
Brian A. Bryce, B. Robert Ilic, et al.
JMM
Hussein I. Hanafi, Sandip Tiwari, et al.
IEEE Transactions on Electron Devices
Brian A. Bryce, Mark C. Reuter, et al.
Nano Letters