Conference paper
Opportunities of Si ULSI Technology for GHz Applications
Jack Y. C. Sun
UEO 1995
Paper
IIIB-2 Channel Length Characterization of LDD MOSFET's-
Abstract
No abstract available.
Related
Matthew R. Wordeman, Robert H. Dennard
IEEE T-ED
George A. Sai-Halasz, Matthew R. Wordeman, et al.
IEEE Journal of Solid-State Circuits
Steven E. Laux, Arvind Kumar, et al.
IEEE TNANO