F.-J. Meyer Zu Heringdorf, M.C. Reuter, et al.
Applied Physics A: Materials Science and Processing
Paper
Imaging with a low-energy electron microscope
Abstract
Low-energy electron microscopy (LEEM) is a relatively new technique for real-time imaging of surfaces. Lateral resolution is in the 150 Å range and single-height atomic steps can be observed. In this paper we describe how to set up a low-energy electron microscope and obtain images in the different imaging modes. © 1993.
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