Conference paper
Submicron high performance bipolar technology
T.C. Chen, J.D. Cressler, et al.
VLSI Technology 1989
Rapid fluctuations of power supply values, or switching noise, can have a significant effect on VLSI circuit speed. This is shown by comparing circuit simulations with measurements of the critical path delay of a self-resetting SRAM. It is shown that including the measured high frequency noise in the circuit simulation leads to very accurate prediction of circuit speed.
T.C. Chen, J.D. Cressler, et al.
VLSI Technology 1989
Y. Mii, S. Rishton, et al.
VLSI Technology 1993
D. Boerstler, Keith A. Jenkins
VLSI Circuits 1998
J. Warnock, P.F. Lu, et al.
IEDM 1989