Microscopy and Microanalysis
Paper
01 Aug 2003

In-situ focused ion beam micropatterning of Ge islands

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Date

01 Aug 2003

Publication

Microscopy and Microanalysis

Authors

  • M. Kammler
  • R. Hull
  • A. Portavoce
  • M.C. Reuter
  • F.M. Ross
IBM-affiliated at time of publication

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