Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper
Infrared measurement of a Tl2Ba2CaCu2O8-x film
Abstract
A preliminary report of the a-b plane reflectivity of a Tl2Ba2CaCu2O8-x film (Tc ≅ 110K) is presented. The plasma edge occurs at ≅ 2000cm-1, which is quite unexpected because it implies an effective carrier density that is an order of magnitude less than obtained in other high temperature CuO superconductors. © 1989.
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