E.A. Giess, B.A. Scott, et al.
Materials Research Bulletin
The crystallization and amorphization of Te-As-Ge films with GaAs injection lasers has been investigated. Power density measurements for crystallization and amorphization are presented, and a reversemode write-read-erase cycle is demonstrated. The results show that direct bit storage is feasible with an injection laser-chalcogenide film system. © 1974 Optical Society of America.
E.A. Giess, B.A. Scott, et al.
Materials Research Bulletin
A.W. Smith
Solid-State Electronics
E.A. Giess, Gerald Burns, et al.
Applied Physics Letters
H.D. Edmonds, A.W. Smith
Applied Physics Letters