John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
No abstract available.
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
David Cash, Dennis Hofheinz, et al.
Journal of Cryptology
M.B. Small, R.M. Potemski
Proceedings of SPIE 1989