Interefrometric measurement of linewidth and noise in gaas lasers

P. Esherick, J.J. Wynne, et al.

Proceedings of SPIE 1989

Joseph M. Blum, J.C. Mcgroddy, et al.

IEEE JQE

J.J. Wynne, J.A. Armstrong, et al.

Physical Review Letters

R.J. Von Gutfeld, A.H. Nethercot, et al.

Physical Review