Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
We report on the interfacial intermixing of ultrathin Co films on a Cu(001) single crystal, two materials that are immiscible in the bulk. With increasing deposition rate we find a crossover from layer-by-layer to bilayer growth due to a hindered diffusion from the first layer to the substrate. Above two monolayers, growth proceeds in a layer-by-layer fashion. These effects are explained in terms of surface free energies. © 1997 Elsevier Science B.V.
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Hiroshi Ito, Reinhold Schwalm
JES
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics