Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
We show that base-stock levels first increase and then decrease as the standard deviation increases for a variety of non-negative random variables with a given mean and provide a distribution-free upper bound for optimal base-stock levels that grows linearly with the standard deviation and then remains constant. © 2007.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
M.B. Small, R.M. Potemski
Proceedings of SPIE 1989
Y.Y. Li, K.S. Leung, et al.
J Combin Optim
Ziv Bar-Yossef, T.S. Jayram, et al.
Journal of Computer and System Sciences