P. Chaudhari, S.R. Herd, et al.
Journal of Non-Crystalline Solids
Optical and Hall effect measurements on thin film layers of polycrystalline IrSi1.75 show that this material is a semiconductor. The band gap is approximately 1.2 eV. The films obtained saturated with silicon were p-type with a charge carrier density of the order of 4×1017 cm -3.
P. Chaudhari, S.R. Herd, et al.
Journal of Non-Crystalline Solids
B. Welber, M.H. Brodsky
Physical Review B
J. De Sousa Pires, F.M. D'Heurle, et al.
Applied Physics Letters
A. Deneuville, M.H. Brodsky
Thin Solid Films