J.E. Smith Jr., M.H. Brodsky, et al.
Physical Review Letters
Optical and Hall effect measurements on thin film layers of polycrystalline IrSi1.75 show that this material is a semiconductor. The band gap is approximately 1.2 eV. The films obtained saturated with silicon were p-type with a charge carrier density of the order of 4×1017 cm -3.
J.E. Smith Jr., M.H. Brodsky, et al.
Physical Review Letters
P.A. Thomas, M.H. Brodsky, et al.
Physical Review B
W.E. Spear, P.G. Le Comber, et al.
Applied Physics Letters
H. Mell, M.H. Brodsky
Thin Solid Films