Y.Y. Li, K.S. Leung, et al.
J Combin Optim
No abstract available.
Y.Y. Li, K.S. Leung, et al.
J Combin Optim
Heinz Koeppl, Marc Hafner, et al.
BMC Bioinformatics
Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
Peter Wendt
Electronic Imaging: Advanced Devices and Systems 1990