Conference paper
RStore: A Direct-Access DRAM-based Data Store
Animesh Trivedi, Patrick Stuedi, et al.
ICDCS 2015
Jitter is one of the most important issues in the design and operation of high-speed serial links. This article focuses on the BERT scan method, a jitter characterization method based on scanning the bit-error rate within the eye diagram. © 2004 IEEE.
Animesh Trivedi, Patrick Stuedi, et al.
ICDCS 2015
Christian Kromer, Gion Sialm, et al.
IEEE Journal of Solid-State Circuits
Marcel Kossel, Thomas Morf, et al.
IEEE MWCL
Robert Birke, Evangelia Kalyvianaki, et al.
IC2EW 2016