Mark W. Dowley
Solid State Communications
Kronig-Penney-type calculations were used to evaluate the tunneling probability through a thin disordered dielectric film between two metallic electrodes. Our calculations indicate that the tunneling probability increases with increasing disorder. © 1972.
Mark W. Dowley
Solid State Communications
Ming L. Yu
Physical Review B
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000