I.F. Chang, S.S. Mitra
Physical Review B
Large photoenhancement (by a factor of ≳100 in some devices) of electroluminescence in thin-film ZnS: Mn devices has been observed near and above the electroluminescence threshold effects when the devices were excited with the near-uv lines of an Ar+ laser. The intensity of the photoenhanced electroluminescence was found to have a sublinear dependence on the laser intensity, saturate, and then decrease with increased laser power.
I.F. Chang, S.S. Mitra
Physical Review B
B. Kazan, I.F. Chang
Proceedings of the IEEE
P.B. Perry, M.W. Shafer, et al.
Journal of Luminescence
G.A. Sai-Halasz, A. Pinczuk, et al.
Solid State Communications