Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
The gate voltage dependence of mobility in pentacene insulated-gate field-effect transistors (IGFET) was investigated. A relatively high dielectric constant barium strontium titanate film was employed as the gate insulator. The operation of the pentacene IGFETs was modeled by standard field effect transistor equations. Typical p-type characteristics were observed, which corresponds to a gate sweep in the saturation regime of operation of an IGFET with channel length L = 4.4 μm and width W = 1500 μm.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
K.A. Chao
Physical Review B
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals