Measurement and digital compensation of crosstalk and photoleakage in high-resolution TFTLCDs

Capacitive crosstalk and TFT photoleakage affect the transmission-voltage array characteristics in high-resolution TFTLCDs. These effects depend upon the drive inversion scheme used, and are image-dependent. Photoleakage can also be a cause of flicker in TFTLCDs at low frame rates. One characterization method utilizes comparison of front-of-screen measurements with either measured test cells or theoretical cell characteristics. A second method utilizes digital crosstalk compensation, in which the image data provided to the panel is modified to offset the effects of crosstalk in various test image patterns.