A. Gangulee, F.M. D'Heurle
Thin Solid Films
To get accurate values of the London penetration depths in YBa2Cu3Ox, μSR measurements were performed on a high quality, sintered sample and a c-axis-oriented polycrystal. For the sintered sample the temperature dependence of the effective penetration depth λeff is well described by the two-fluid model, with λeff(0) = 155(10) nm. This behavior of λeff(T) is consistent with conventional s-wave pairing. The anisotropy ratio λc λab {reversed tilde equals} 5(1) was determined from measurements on the polycrystal. These results were used to calculate λab(0) = 130(10) nm and λc(0) {reversed tilde equals} 500 - 800 nm. © 1989.
A. Gangulee, F.M. D'Heurle
Thin Solid Films
R. Ghez, J.S. Lew
Journal of Crystal Growth
Frank Stem
C R C Critical Reviews in Solid State Sciences
J. Tersoff
Applied Surface Science