Joachim N. Burghartz, Keith A. Jenkins, et al.
IEEE Electron Device Letters
Paper
Measurement of VLSI Power Supply Current by Electron-Beam Probing
Abstract
The measurement of power supply noise and current by electron-beam probing is described. Noise measurements can be made on the chip under test, and current measurements can be made on the circuit board. © 1992 IEEE
Related
Keith A. Jenkins
IEEE Design and Test of Computers
Conference paper
Substrate coupling noise issues in silicon technology
Keith A. Jenkins
SiRF 2004
Keith A. Jenkins, Pong-Fei Lu
Microelectronics Reliability