R. Ghez, J.S. Lew
Journal of Crystal Growth
Paper
Measurements of conductivity near the metal-insulator critical point
Abstract
We present measurements of the electrical conductivity at low temperatures of bulk samples of Si
Related
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
A. Krol, C.J. Sher, et al.
Surface Science