Conference paper
Will SOI have a life for the low-power market?
Jin Cai, Zhibin Ren, et al.
IEEE International SOI Conference 2008
A simple method for determining both the emitter and the base series resistances of bipolar transistors from the measured I-V characteristics is described. The method is based on the observation that deviation of the base current from the ideal exp (qVBE/kT) behavior at high currents can be attributed solely and relatively simply to series resistances. Series resistances determined by this method are given for sample high-speed digital bipolar transistors. © 1984 IEEE
Jin Cai, Zhibin Ren, et al.
IEEE International SOI Conference 2008
Jeng-Bang Yau, Jin Cai, et al.
IEEE T-ED
J. Cai, Tak H. Ning, et al.
S3S 2013
Yuan Taur, Tak H. Ning
Materials Chemistry and Physics