Oliver C. Wells
Journal of Microscopy
Paper
Method for measuring the field from a magnetic recording head in the scanning electron microscope
Abstract
No abstract available.
Related
Conference paper
The early history and future of the SEM
Oliver C. Wells, David C. Joy
Surface and Interface Analysis
Kenneth C.A. Smith, Oliver C. Wells, et al.
IC-CPO 2006
Conference paper
The history and future of the SEM - A personal view
Oliver C. Wells
M&M 2006