Journal of Microscopy

Paper

02 Aug 2011

Method for measuring the field from a magnetic recording head in the scanning electron microscope

View publication

Abstract

No abstract available.

Paper

Schlieren method as applied to magnetic recording heads in the scanning electron microscope

Oliver C. Wells, Matthias Brunner

Applied Physics Letters

Paper

Relationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic field

Oliver C. Wells, Catherine A. Stoye

Journal of Microscopy

Paper

Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscope

Oliver C. Wells, L. Gignac, et al.

Scanning

Conference paper

Past, present, and future of backscatter electron (BSE) imaging

Oliver C. Wells, Michael S. Gordon, et al.

ScMi 2012

View all publications