PaperFundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)Oliver C. WellsJournal of Microscopy
PaperUse of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscopeOliver C. Wells, L. Gignac, et al.Scanning
PaperApplication of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samplesOliver C. Wells, Maurice McGlashan-Powell, et al.Scanning