George Y. Onoda, Paul J. Steinhardt, et al.
Physical Review Letters
We propose a model for 1/f flux noise in superconducting devices (f is frequency). The noise is generated by the magnetic moments of electrons in defect states which they occupy for a wide distribution of times before escaping. A trapped electron occupies one of the two Kramers-degenerate ground states, between which the transition rate is negligible at low temperature. As a result, the magnetic moment orientation is locked. Simulations of the noise produced by randomly oriented defects with a density of 5×1017m-2 yield 1/f noise magnitudes in good agreement with experiments. © 2007 The American Physical Society.
George Y. Onoda, Paul J. Steinhardt, et al.
Physical Review Letters
Luca Chirolli, Guido Burkard, et al.
Physical Review Letters
Ted R. Clem, David J. Overway, et al.
IEEE TAS
John Clarke, Roger H. Koch
Science