An analytical model for intrinsic carbon nanotube FETs
Lan Wei, David J. Frank, et al.
ESSDERC 2008
Ideally, a metal-oxide-semiconductor field-effect transistor (MOSFET) has high drive current and low leakage current. As the MOSFET channel length is reduced to 50 nm and below, the suppression of off-state leakage current becomes an increasingly difficult technological challenge-one that will ultimately limit the scalability of the conventional MOSFET structure. This paper reviews recent research performed at the University of California at Berkeley on advanced transistor structures that can extend the limit of device scaling to below 10 nm for future generations of MOS technology.
Lan Wei, David J. Frank, et al.
ESSDERC 2008
Suyoung Bang, Jae-Sun Seo, et al.
VLSI Circuits 2015
Swagath Venkataramani, Vijayalakshmi Srinivasan, et al.
ISCA 2021
David J. Frank, Leland Chang, et al.
IEDM 2011