Paper

01 Jan 1979

MP-B5 Graded or Stepped Insulator MIS Structures (GI-MIS or SI-MIS)

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Abstract

No abstract available.

Paper

Determination of insulator bulk trapped charge densities and centroids from photocurrent-voltage charactersitcs of MOS structures

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Non-Arrhenius temperature dependence of reliability in ultrathin silicon dioxide films

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Room-temperature conductivity and location of mobile sodium ions in the thermal silicon dioxide layer of a metal-silicon dioxide-silicon structure

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