C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N - 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. © 2007 IEEE.
C.M. Brown, L. Cristofolini, et al.
Chemistry of Materials
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials
David B. Mitzi
Journal of Materials Chemistry
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999