S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
A practical multiport measurement method is presented for the precise characterization of an N-port device using a two-port vector network analyzer. Because the N - 2 unused ports need not be terminated with matched loads, a test fixture can be simplified. Any influence of the reflections from the unterminated ports can be deembedded by port renormalization. The proposed method was verified with a coupled microstrip line structure. © 2007 IEEE.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
U. Wieser, U. Kunze, et al.
Physica E: Low-Dimensional Systems and Nanostructures
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications
Andreas C. Cangellaris, Karen M. Coperich, et al.
EMC 2001