Characterization of line width variation
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Systems of difference equations containing small parameters are studied by a constructive perturbation scheme analogous to the one developed by the authors for the study of differential equations. The method results in an averaging procedure for difference equations, and it is particularly well suited to certain highly oscillatory, nonlinear systems. The method is applied to problems from population genetics, pattern recognition, and the numerical analysis of stiff differential equations.
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Jaione Tirapu Azpiroz, Alan E. Rosenbluth, et al.
SPIE Photomask Technology + EUV Lithography 2009
Richard M. Karp, Raymond E. Miller
Journal of Computer and System Sciences
Barry E. Willner, Willard L. Miranker, et al.
Biological Cybernetics