True 3-D displays for avionics and mission crewstations
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
High resolution electron microscopy studies of the oxidation of vapor deposited Cu (<30 ) on thin single crystal Au films are reported. The metal/metal and oxide/metal orientation relationships are obtained for both the diffraction and imaging modes, before and after the Cu oxidation is significant. For the oxidized overlayers, two cases are observed: Cu(111) which transforms to three Cu2O(110) variants and Cu(110) transforming to (211) oxide overgrowth. A lateral displacement of the top Cu layer in the (110) stacking sequence is detected in the first case and atomic layering is observed in the 6-layer lattice structure of the Cu2O(211) orientation. © 1987 Elsevier Science Publishers B.V. (North-Holland Physics Publishing Division).
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Ming L. Yu
Physical Review B
Frank Stem
C R C Critical Reviews in Solid State Sciences
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films