Conference paper
Characterization of line width variation
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Two algorithms are presented and analyzed, which compute the distance between any pair of leaves of a complete tree. The first algorithm is quite efficient, running in time 0(log2 distance) on a uniform-cost RAM. The second algorithm is somewhat less efficient, though it too runs on a uniform-cost RAM in time O(log2 distance); it is presented mainly because its validity depends on an interesting numerological descriptor of complete trees. © 1980, Taylor & Francis Group, LLC
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Arnold L. Rosenberg
Journal of the ACM
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Matthew A Grayson
Journal of Complexity