Single and dual wavelength exposure of photoresist
J. LaRue, C. Ting
Proceedings of SPIE 1989
We consider asymptotic behavior of partial sums and sample covariances for linear processes whose innovations are dependent. Central limit theorems and invariance principles are established under fairly mild conditions. Our results go beyond earlier ones by allowing a quite wide class of innovations which includes many important nonlinear time series models. Applications to linear processes with GARCH innovations and other nonlinear time series models are discussed. © 2005 Elsevier B.V. All rights reserved.
J. LaRue, C. Ting
Proceedings of SPIE 1989
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Active Matrix Liquid Crystal Displays Technology and Applications 1997
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CCS 2024
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IEEE Transactions on Pattern Analysis and Machine Intelligence