I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Resonances in the inversion layer for infrared fields normal to the interface do not occur at the electric subband splittings. They are shifted from the subband splittings by resonant screening of the infrared field. The corrections for (100) Si surfaces are shown to be comparable to the shifts ascribed to many-body effects. © 1993.
I.K. Pour, D.J. Krajnovich, et al.
SPIE Optical Materials for High Average Power Lasers 1992
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering