Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
The current density is calculated for the case where both ohmic and space charge limited (SCL) contributions are important. It is shown that, although the actual current is less than the sum of the currents which would be obtained individually from the ohmic or SCL conduction mechanisms, the error involved in assuming their additivity is not large. © 1982.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
R. Ghez, M.B. Small
JES
John G. Long, Peter C. Searson, et al.
JES
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films