Vladimir Yanovski, Israel A. Wagner, et al.
Ann. Math. Artif. Intell.
Some theoretical and practical aspects of common random numbers (CRN) for variance reduction in simulation analysis are considered. A simple proof of the optimality of CRN is presented and the efficiency of this technique for variance reduction is discussed. Applications of CRN to production planning and inventory problems while using stochastic approximation are given. © 1984.
Vladimir Yanovski, Israel A. Wagner, et al.
Ann. Math. Artif. Intell.
John A. Hoffnagle, William D. Hinsberg, et al.
Microlithography 2003
Satoshi Hada
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
Fausto Bernardini, Holly Rushmeier
Proceedings of SPIE - The International Society for Optical Engineering