William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
We have examined the dependence of a resistance on the cross-sectional area and on temperature of amorphous W-Re films. We find that the data qualitatively fits the expression for one dimensional quantum localization. © 1980.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
Mark W. Dowley
Solid State Communications
T.N. Morgan
Semiconductor Science and Technology