Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
In this paper we identify a class of estimation problems in which sequential estimation procedures do not yield a better rate of convergence then procedures in which all the observations are preassigned in advance. © 1980, Taylor & Francis Group, LLC. All rights reserved.
Moutaz Fakhry, Yuri Granik, et al.
SPIE Photomask Technology + EUV Lithography 2011
M. Tismenetsky
International Journal of Computer Mathematics
David L. Shealy, John A. Hoffnagle
SPIE Optical Engineering + Applications 2007
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SCC 2007