O.C. Wells, Maurice McGlashen-Powell, et al.
Scanning
Paper
Penetration effect at sharp edges in the scanning electron microscope
Abstract
No abstract available.
Related
O.C. Wells, P. Coane, et al.
Microbeam Analysis 1982
N.G. Ainslie, F.M. D'Heurle, et al.
Applied Physics Letters
L. Gignac, O.C. Wells, et al.
Microscopy and Microanalysis