Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Variable-wavelength photocurrent microscopy and photocurrent spectroscopy are used to study the photoresponse of (n, m) sorted single-walled carbon nanotube (SWNT) devices. The measurements of (n, m) pure SWCNT devices demonstrate the ability to study the wavelength-dependent photoresponse in situ in a device configuration and deliver photocurrent spectra that reflect the population of the source material. Furthermore, we show that it is possible to map and determine the chirality population within a working optoelectronic SWCNT device. (Figure Presented).
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
A. Reisman, M. Berkenblit, et al.
JES
A. Gangulee, F.M. D'Heurle
Thin Solid Films
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983