Ritwik Kumar, Arunava Banerjee, et al.
IEEE TPAMI
We present the first lithography results that use high-numerical-aperture photon sieves as focusing elements in a scanning-optical-beam-lithography system J. Vac. Sci. Technol. B 21, 2810 2003. Photon sieves are novel optical elements that offer the advantages of higher resolution and improved image contrast compared with traditional diffractive optics such as zone plates Nature 414, 184 (2001). We fabricated the highest-numerical-aperture photon sieves reported to date and experimentally verified their focusing characteristics. We propose two new designs of the photon sieve that have the potential to significantly increase focusing efficiency. © 2005 Optical Society of America.
Ritwik Kumar, Arunava Banerjee, et al.
IEEE TPAMI
Vivek Tyagi, Hima P. Karanam, et al.
ICPR 2012
Xiaohui Shen, Gang Hua, et al.
FG 2011
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence