F.A. Houle, W.D. Hinsberg
Surface Science
Photodesorption of SiF3 groups, which are the principal adsorbates on a silicon surface during etching by XeF2, is found to be responsible for the etch-rate enhancement observed under illumination by low-power, cw band-gap radiation. It is proposed that desorption is stimulated by photogenerated- charge-carrier mediated chemical reaction, and not the simple charge trapping and recombination mechanism usually invoked for desorption from semiconductor surfaces. © 1988 The American Physical Society.
F.A. Houle, W.D. Hinsberg
Surface Science
W.D. Hinsberg, F.A. Houle, et al.
Microlithography 2000
Harold F. Winters, F.A. Houle
Journal of Applied Physics
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