Fan Zhang, Junwei Cao, et al.
IEEE TETC
The post-silicon validation phase in a processor's design life cycle is geared towards nding all remaining bugs in the sys- tem. It is, in fact, our last opportunity to nd functional and electrical bugs in the design before shipping it to customers. In this paper, we provide a high-level overview of the methodology and technologies put into use as part of the POWER8 post-silicon functional validation phase. We de- scribe the results and list the primary factors that con- tributed to this highly successful bring-up. Copyright 2014 ACM.
Fan Zhang, Junwei Cao, et al.
IEEE TETC
Mahmoud Elbayoumi, Mihir Choudhuryy, et al.
DAC 2014
David S. Kung
DAC 1998
Rajeev Gupta, Shourya Roy, et al.
ICAC 2006