Mechanisms and models of Si film growth from SiH4 and Si2H6
S. Gates, S.K. Kulkarni, et al.
Symposium on Process Physics and Modeling in Semiconductor Technology 1990
Adsorption of SiClH3 and SiCl2H2 on Si(100) is studied as a function of surface temperature, comparing these precursors for Si atomic layer epitaxy (ALE). At 450-550°C, a substantial surface H coverage (θH) exists during SiClH3 adsorption, and θH exhibits transient behavior. During SiCl2H2 adsorption, θH is much smaller. At 500°C with SiCl2H2, ≅1 monolayer of Cl is formed after ≅4×1019 cm-2 exposure. Dichlorosilane is a suitable precursor for Si ALE, but desorption of HCl is significant at T≳500°C so that SiCl2H2 adsorption is not strictly self-limiting.
S. Gates, S.K. Kulkarni, et al.
Symposium on Process Physics and Modeling in Semiconductor Technology 1990
S. Gates, D.D. Koleske
Applied Physics Letters
S. Gates, C.M. Greenlief, et al.
The Journal of Chemical Physics
D.D. Koleske, S. Gates, et al.
The Journal of Chemical Physics