H.D. Dulman, R.H. Pantell, et al.
Physical Review B
State-of-the-art resist for 193 nm lithography are analyzed with respect to possible resolution, photospeed and etch resistance. This paper describes this photoresist design study and emphasizes the many opportunities and challenges that the photoresist and semiconductor industry face with the unfolding of this technology.
H.D. Dulman, R.H. Pantell, et al.
Physical Review B
David B. Mitzi
Journal of Materials Chemistry
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery