Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
State-of-the-art resist for 193 nm lithography are analyzed with respect to possible resolution, photospeed and etch resistance. This paper describes this photoresist design study and emphasizes the many opportunities and challenges that the photoresist and semiconductor industry face with the unfolding of this technology.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
P.C. Pattnaik, D.M. Newns
Physical Review B
Eloisa Bentivegna
Big Data 2022