F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
We have used photoluminescence from nonequilibrium electrons recombining at neutral acceptors to quantitatively measure hot electron kinetics in GaAs. Values have been obtained for intervalley scattering rates as a function of electron kinetic energy and the scattering rate of a single nonequilibrium electron in the presence of a sea of thermalized carriers. These measurements demonstrate the power of this new probe of nonequilibrium carrier relaxation in direct gap semiconductors. © 1989.
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
Fernando Marianno, Wang Zhou, et al.
INFORMS 2021
Frank Stem
C R C Critical Reviews in Solid State Sciences