John G. Long, Peter C. Searson, et al.
JES
A phenomenological explanation of Raman scattering in amorphous Si, Ge and III-V semiconductors is given, using Si as an example. Several applications of Raman scattering to the study of amorphous materials are discussed. © 1972.
John G. Long, Peter C. Searson, et al.
JES
Frank Stem
C R C Critical Reviews in Solid State Sciences
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
G. Will, N. Masciocchi, et al.
Zeitschrift fur Kristallographie - New Crystal Structures