Conference paper
True 3-D displays for avionics and mission crewstations
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
A phenomenological explanation of Raman scattering in amorphous Si, Ge and III-V semiconductors is given, using Si as an example. Several applications of Raman scattering to the study of amorphous materials are discussed. © 1972.
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
Mark W. Dowley
Solid State Communications
A. Gangulee, F.M. D'Heurle
Thin Solid Films
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids