A. Gangulee, F.M. D'Heurle
Thin Solid Films
A phenomenological explanation of Raman scattering in amorphous Si, Ge and III-V semiconductors is given, using Si as an example. Several applications of Raman scattering to the study of amorphous materials are discussed. © 1972.
A. Gangulee, F.M. D'Heurle
Thin Solid Films
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989