Frank Stem
C R C Critical Reviews in Solid State Sciences
The present status of ellipsometric measurement capability is reviewed. Significant advances since the last ellipsometry conference are highlighted. © 1980.
Frank Stem
C R C Critical Reviews in Solid State Sciences
Shaoning Yao, Wei-Tsu Tseng, et al.
ADMETA 2011
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
T.N. Morgan
Semiconductor Science and Technology