Hiroshi Ito, Reinhold Schwalm
JES
The present status of ellipsometric measurement capability is reviewed. Significant advances since the last ellipsometry conference are highlighted. © 1980.
Hiroshi Ito, Reinhold Schwalm
JES
J. Tersoff
Applied Surface Science
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
A. Gangulee, F.M. D'Heurle
Thin Solid Films