Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
The graphitelike model recently proposed by Jones and Holland for the structure of a laser-stabilized Si{111}1×1 surface is subjected to a new low-energy electron-diffraction (LEED) intensity analysis and compared to the relaxed-bulk model produced by earlier LEED analyses. Three different reliability factors applied to the normal-incidence data, and visual evaluation of non-normal-incidence data, discriminate unambiguously in favor of the relaxed-bulk model against the graphitelike model. © 1986 The American Physical Society.
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting