Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
The graphitelike model recently proposed by Jones and Holland for the structure of a laser-stabilized Si{111}1×1 surface is subjected to a new low-energy electron-diffraction (LEED) intensity analysis and compared to the relaxed-bulk model produced by earlier LEED analyses. Three different reliability factors applied to the normal-incidence data, and visual evaluation of non-normal-incidence data, discriminate unambiguously in favor of the relaxed-bulk model against the graphitelike model. © 1986 The American Physical Society.
Shu-Jen Han, Dharmendar Reddy, et al.
ACS Nano
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films