John G. Long, Peter C. Searson, et al.
JES
The graphitelike model recently proposed by Jones and Holland for the structure of a laser-stabilized Si{111}1×1 surface is subjected to a new low-energy electron-diffraction (LEED) intensity analysis and compared to the relaxed-bulk model produced by earlier LEED analyses. Three different reliability factors applied to the normal-incidence data, and visual evaluation of non-normal-incidence data, discriminate unambiguously in favor of the relaxed-bulk model against the graphitelike model. © 1986 The American Physical Society.
John G. Long, Peter C. Searson, et al.
JES
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
Shaoning Yao, Wei-Tsu Tseng, et al.
ADMETA 2011