P.-E. Hellberg, S.-L. Zhang, et al.
Journal of Applied Physics
Solid solutions of CoSi2 and NiSi2 were prepared from the solid-state reaction of thin films of Ni-Co alloys with their silicon substrates. The room-temperature resistivity of these silicide solid solutions does not increase parabolically, but (within the sensitivity of the measurements) varies linearly with composition. A model is proposed which explains the very weak alloy scattering on the basis that in these disilicides (a) the d bands are pushed below the Fermi level, (b) conduction occurs mostly via s electrons, and (c) there is no s-d scattering.
P.-E. Hellberg, S.-L. Zhang, et al.
Journal of Applied Physics
J.J. Zhang, A. Rastelli, et al.
Applied Physics Letters
S.-L. Zhang, J.M.E. Harper, et al.
Journal of Electronic Materials
J. Tersoff, Yuhai Tu, et al.
Applied Physics Letters