Conference paper
Sub-40nm V-groove MOSFETs
J. Appenzeller, R. Martel, et al.
DRC 2001
Periodic structure is observed in the current-voltage characteristics at 4.2 K of n-GaAs-AlxGa1-xAs-n+GaAs capacitors, grown by molecular beam epitaxy, which have AlxGa 1-xAs thicknesses of 30-35 nm. The periodicities can be explained quantitatively by the theory of resonant Fowler-Nordheim tunneling.
J. Appenzeller, R. Martel, et al.
DRC 2001
T.N. Theis, B.D. Parker, et al.
Applied Physics Letters
T.W. Hickmott, P. Solomon, et al.
Journal of Applied Physics
T.W. Hickmott, P. Solomon, et al.
Physical Review Letters