Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Scanning Tunneling Microscopy (STM) on boron-doped, p-type Si(111) confirmed the main structural features of the 7 × 7 reconstruction of nearly intrinsic n-type material, in particular the three-fold rotational symmetry. In the p-doped material, one distinct maximum is absent in about every fifth cell. This is attributed to a surface-boron dopant, implying an appreciable surface segregation of boron. © 1985.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
A. Krol, C.J. Sher, et al.
Surface Science
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Journal of Physics and Chemistry of Solids
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Micro and Nano Engineering